Scanning Hall probe microscope
Scanning Hall probe microscope (SHPM) is a variety of a scanning probe microscope which incorporates accurate sample approach and positioning of the scanning tunnelling microscope with a semiconductor Hall sensor. This combination allows to map the magnetic induction associated with a sample. Current state of the art SHPM systems utilize 2D electron gas materials (e.g. GaAs/AlGaAs) to provide high spatial resolution (~300 nm) imaging with high magnetic field sensitivity. Unlike the magnetic force microscope the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K).[1]
References
- ^ Chang, A. M.; Hallen, H. D.; Harriott, L.; Hess, H. F.; Kao, H. L.; Kwo, J.; Miller, R. E.; Wolfe, R. et al. (1992). "Scanning Hall probe microscopy". Appl. Phys. Lett. 61 (16): 1974. doi:10.1063/1.108334.
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